Atomic force microscopy in process engineering : (Record no. 30730)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 01725cam a2200229 a 4500 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | OSt |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20231113095944.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 130303s2009 enka g b 001 0beng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9781856175173 |
| 040 ## - CATALOGING SOURCE | |
| Original cataloging agency | DSQC |
| Transcribing agency | DSQC |
| 050 #0 - LIBRARY OF CONGRESS CALL NUMBER | |
| Classification number | QH212.A78 |
| Item number | B69 2009 |
| 100 1# - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Bowen, W. Richard. |
| 245 00 - TITLE STATEMENT | |
| Title | Atomic force microscopy in process engineering : |
| Remainder of title | introduction to AFM for improved processes and products / |
| Statement of responsibility, etc. | Edited by W. Richard Bowen, Nidal Hilal. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | Oxford, New York : |
| Name of publisher, distributor, etc. | Butterworth-Heinemann, |
| Date of publication, distribution, etc. | 2009. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | xvi, 283 p. : |
| Other physical details | ill. ; |
| Dimensions | 24 cm. |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE | |
| Bibliography, etc. note | Includes index. |
| 505 0# - FORMATTED CONTENTS NOTE | |
| Formatted contents note | BASIC PRINCIPLES OF ATOMIC FORCE MICROSCOPY / W Richard Bowen, Nidal Hilal and Daniel Johnson -- CHARACTERISATION OF MEMBRANE SURFACES / W Richard Bowen, Nidal Hilal and Teodora Doneva -- AFM AND DEVELOPMENT OF (BIO)FOULING RESISTANT MEMBRANES / W Richard Bowen, Nidal Hilal, Huabing Yin and Laila Al-Khatib -- APPLICATION OF ATOMIC FORCE MICROSCOPY TO PARTICLE-PARTICLE INTERACTIONS / Nidal Hilal, Yuncheng Liang and Daniel Johnson -- QUANTIFICATION OF PARTICLE-BUBBLE INTERACTIONS / Nidal Hilal and Daniel Johnson -- NANOSCALE ANALYSIS OF PHARMACEUTICALS BY SCANNING PROBE MICROSCOPY / Clive J Roberts -- THE APPLICATION OF AFM WITHIN BIOPROCESS ENGINEERING / Chris J Wright -- THE APPLICATION OF AFM TO THE DEVELOPMENT OF PROCESS PLANT MATERIALS / Chris J Wright -- ATOMIC FORCE MICROSCOPY AND POLYMERS ON SURFACES / Vasileios Koutsos -- AFM-BASED MICRO/NANO-RHEOMETRY / Matthew S Barrow and P Rhodri Williams -- CONCLUSIONS AND FUTURE OUTLOOK / W Richard Bowen and Nidal Hilal. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Atomic force microscopy. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Production engineering. |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Hilal, Nidal. |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Source of classification or shelving scheme | Library of Congress Classification |
| Koha item type | Books |
| Source of classification or shelving scheme | Not for loan | Home library | Current library | Date acquired | Total Checkouts | Full call number | Barcode | Date last seen | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|
| Library of Congress Classification | القاعة الأجنبية | The Foreign Hall | القاعة الأجنبية | The Foreign Hall | 11/13/2023 | QH212.A78 B69 2009 | 0027898 | 11/13/2023 | 11/13/2023 | Books |