Atomic force microscopy in process engineering : introduction to AFM for improved processes and products /
Bowen, W. Richard.
Atomic force microscopy in process engineering : introduction to AFM for improved processes and products / Edited by W. Richard Bowen, Nidal Hilal. - Oxford, New York : Butterworth-Heinemann, 2009. - xvi, 283 p. : ill. ; 24 cm.
Includes index.
BASIC PRINCIPLES OF ATOMIC FORCE MICROSCOPY / W Richard Bowen, Nidal Hilal and Daniel Johnson -- CHARACTERISATION OF MEMBRANE SURFACES / W Richard Bowen, Nidal Hilal and Teodora Doneva -- AFM AND DEVELOPMENT OF (BIO)FOULING RESISTANT MEMBRANES / W Richard Bowen, Nidal Hilal, Huabing Yin and Laila Al-Khatib -- APPLICATION OF ATOMIC FORCE MICROSCOPY TO PARTICLE-PARTICLE INTERACTIONS / Nidal Hilal, Yuncheng Liang and Daniel Johnson -- QUANTIFICATION OF PARTICLE-BUBBLE INTERACTIONS / Nidal Hilal and Daniel Johnson -- NANOSCALE ANALYSIS OF PHARMACEUTICALS BY SCANNING PROBE MICROSCOPY / Clive J Roberts -- THE APPLICATION OF AFM WITHIN BIOPROCESS ENGINEERING / Chris J Wright -- THE APPLICATION OF AFM TO THE DEVELOPMENT OF PROCESS PLANT MATERIALS / Chris J Wright -- ATOMIC FORCE MICROSCOPY AND POLYMERS ON SURFACES / Vasileios Koutsos -- AFM-BASED MICRO/NANO-RHEOMETRY / Matthew S Barrow and P Rhodri Williams -- CONCLUSIONS AND FUTURE OUTLOOK / W Richard Bowen and Nidal Hilal.
9781856175173
Atomic force microscopy.
Production engineering.
QH212.A78 / B69 2009
Atomic force microscopy in process engineering : introduction to AFM for improved processes and products / Edited by W. Richard Bowen, Nidal Hilal. - Oxford, New York : Butterworth-Heinemann, 2009. - xvi, 283 p. : ill. ; 24 cm.
Includes index.
BASIC PRINCIPLES OF ATOMIC FORCE MICROSCOPY / W Richard Bowen, Nidal Hilal and Daniel Johnson -- CHARACTERISATION OF MEMBRANE SURFACES / W Richard Bowen, Nidal Hilal and Teodora Doneva -- AFM AND DEVELOPMENT OF (BIO)FOULING RESISTANT MEMBRANES / W Richard Bowen, Nidal Hilal, Huabing Yin and Laila Al-Khatib -- APPLICATION OF ATOMIC FORCE MICROSCOPY TO PARTICLE-PARTICLE INTERACTIONS / Nidal Hilal, Yuncheng Liang and Daniel Johnson -- QUANTIFICATION OF PARTICLE-BUBBLE INTERACTIONS / Nidal Hilal and Daniel Johnson -- NANOSCALE ANALYSIS OF PHARMACEUTICALS BY SCANNING PROBE MICROSCOPY / Clive J Roberts -- THE APPLICATION OF AFM WITHIN BIOPROCESS ENGINEERING / Chris J Wright -- THE APPLICATION OF AFM TO THE DEVELOPMENT OF PROCESS PLANT MATERIALS / Chris J Wright -- ATOMIC FORCE MICROSCOPY AND POLYMERS ON SURFACES / Vasileios Koutsos -- AFM-BASED MICRO/NANO-RHEOMETRY / Matthew S Barrow and P Rhodri Williams -- CONCLUSIONS AND FUTURE OUTLOOK / W Richard Bowen and Nidal Hilal.
9781856175173
Atomic force microscopy.
Production engineering.
QH212.A78 / B69 2009