000			01725cam a2200229 a 4500
003			OSt
005			20231113095944.0
008			130303s2009 enka g b 001 0beng d
020			_a9781856175173
040			_aDSQC _cDSQC
050		0	_aQH212.A78 _bB69 2009
100	1		_aBowen, W. Richard.
245	0	0	_aAtomic force microscopy in process engineering : _bintroduction to AFM for improved processes and products / _cEdited by W. Richard Bowen, Nidal Hilal.
260			_aOxford, New York : _bButterworth-Heinemann, _c2009.
300			_axvi, 283 p. : _bill. ; _c24 cm.
504			_aIncludes index.
505	0		_aBASIC PRINCIPLES OF ATOMIC FORCE MICROSCOPY / W Richard Bowen, Nidal Hilal and Daniel Johnson -- CHARACTERISATION OF MEMBRANE SURFACES / W Richard Bowen, Nidal Hilal and Teodora Doneva -- AFM AND DEVELOPMENT OF (BIO)FOULING RESISTANT MEMBRANES / W Richard Bowen, Nidal Hilal, Huabing Yin and Laila Al-Khatib -- APPLICATION OF ATOMIC FORCE MICROSCOPY TO PARTICLE-PARTICLE INTERACTIONS / Nidal Hilal, Yuncheng Liang and Daniel Johnson -- QUANTIFICATION OF PARTICLE-BUBBLE INTERACTIONS / Nidal Hilal and Daniel Johnson -- NANOSCALE ANALYSIS OF PHARMACEUTICALS BY SCANNING PROBE MICROSCOPY / Clive J Roberts -- THE APPLICATION OF AFM WITHIN BIOPROCESS ENGINEERING / Chris J Wright -- THE APPLICATION OF AFM TO THE DEVELOPMENT OF PROCESS PLANT MATERIALS / Chris J Wright -- ATOMIC FORCE MICROSCOPY AND POLYMERS ON SURFACES / Vasileios Koutsos -- AFM-BASED MICRO/NANO-RHEOMETRY / Matthew S Barrow and P Rhodri Williams -- CONCLUSIONS AND FUTURE OUTLOOK / W Richard Bowen and Nidal Hilal.
650		0	_aAtomic force microscopy.
650		0	_aProduction engineering.
700	1		_aHilal, Nidal.
942			_2lcc _cBK
999			_c30730 _d30730